High-Resolution Differential Phase Contrast Imaging Using Microfocus X-Ray Sources

We combined grating-based phase contrast imaging with projection magnification using a high-brilliance microfocus x-ray source. This geometry offers increased detection efficiency even at higher energies for quantitative high-resolution phase contrast imaging. By systematic methodical investigations, it is shown, how the primary measurement signal is affected by the magnification factor. Furthermore, the influences of different physical parameters, as the size or the energy spectrum of the x-ray source, on the measurement results are discussed using numerical simulations. Based on these investigations, the phase shift can be determined quantitatively with high precision. Finally, experimental results demonstrate feasible applications like quality inspection of refractive x-ray lenses and high-resolution phase contrast tomography.